Industrial Microscope

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FPD/LSI Inspection Microscopes

Enhanced observation, durability and operational performance, combined with improved functionality between the microscope and digital cameras provide ideal imaging..

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ECLIPSE LV150N / LV150NA

A manual, nosepiece type microscope which meets the various needs of observation, inspection, research and analysis across a wide range of industrial fields. Higher NA and a longer working distance than ever before means superior optical performance and efficient digital imaging.

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ECLIPSE LV100ND / LV100NDA

Compatible with brightfield, darkfield, simple polarizing, DIC, epifluorescence and two-beam interferometry observations. Furthermore, phase contrast and DIC observation with diascopic illumination are also possible. It supports diverse and advanced research, analysis and inspection.

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ECLIPSE MA200 Microscope type

All controls are on the front of the instrument. Delivers ease-of-use by placing all important controls on the front.

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ECLIPSE MA100N

The MA100N is a compact inverted microscope designated for bright field and simple polarizing observations. Responding to the requests from manufacturing and QA/QC sections in a variety of industries, Nikon developed this simple but durable model which enables high contrast image observation and capture. Further, the high intensity LED illumination reduces the need for frequent lamp replacement.

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Accessories for Industrial Microscopes
Stages for Measuring Instruments/ Rotating Table for Measuring Instruments/ Digital Printer DPU-414/ 300mm Standard Scale/ Inspection Result Sheet Generation Software Custom Fit QC

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Micorsocpe Components

Nikons broad variety of modular units to give you greater flexibility in configuring a system best suited to your purpose.

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Imaging Software

NIS-Elements revolutionizes imaging software for the microscopy market by combining automated intelligence to microscopes, cameras, components and peripherals with powerful archiving, analysis and visualization tools. Its intuitive interface simplifies workflow and speeds up image acquisition times while providing powerful features such as image stitching, object counting and volume views.